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JEDEC Solid State Technology Association, 02/01/1986
Publisher: JEDEC
File Format: PDF
$39.00$78.00
Published:01/02/1986
Pages:38
File Size:1 file
Note:This product is unavailable in Russia, Ukraine, Belarus
FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
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DDR2 SDRAM SPECIFICATION
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3D Chip Stack with Through-Silicon Vias (TSVS): Identifying, Evaluating and Understanding Reliability Interactions
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TERMS, DEFINITIONS, AND LETTER SYMBOLS FOR DISCRETE SEMICONDUCTOR AND OPTOELECTRONIC DEVICES
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