Your shopping cart is empty!
JEDEC Solid State Technology Association, 09/01/2010
Publisher: JEDEC
File Format: PDF
$37.00$74.00
Published:01/09/2010
Pages:32
File Size:1 file , 210 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
CONSTANT-TEMPERATURE AGING METHOD TO CHARACTERIZE COPPER INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDING
$36.00 $72.00
Descriptive Designation System for Semiconductor-device Packages
$58.00 $116.00
Graphics Double Data Rate (GDDR6) SGRAM Standard
$114.00 $228.00
Universal Flash Storage (UFS) Test
$152.00 $305.00