JEDEC JESD 22-A108C

TEMPERATURE, BIAS, AND OPERATING LIFE

JEDEC Solid State Technology Association, 06/01/2005

Publisher: JEDEC

File Format: PDF

$27.00$54.00

Description

Published:01/06/2005

Pages:13

File Size:1 file , 79 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

A revised method for determining the effects of bias conditions and temperature, over time, on solid state devices is now available. Revision B of A108 includes low temperature operating life (LTOL) and high temperature gate bias (HTGB) stress conditions, revised cool down requirements for high temperature stress, and a procedure to follow if parts are not tested within the allowed time window.

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