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JEDEC Solid State Technology Association, 06/01/2005
Publisher: JEDEC
File Format: PDF
$27.00$54.00
Published:01/06/2005
Pages:13
File Size:1 file , 79 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
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Graphics Double Data Rate (GDDR6) SGRAM Standard
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EXPANDED SERIAL PERIPHERAL INTERFACE (xSPI) FOR NON VOLATILE MEMORY DEVICES, VERSION 1.0
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ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
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