• Your shopping cart is empty!

  • JEDEC JESD 22-A110C

JEDEC JESD 22-A110C

HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)

JEDEC Solid State Technology Association, 01/01/2009

Publisher: JEDEC

File Format: PDF

$27.00$54.00


Published:01/01/2009

Pages:14

File Size:1 file , 93 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

The purpose of this test method is to evaluate the reliability of nonhermetic packaged solid state devices in humid environments. It employs severe conditions of temperature, humidity, and bias that accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it.

More JEDEC standard pdf

JEDEC J-STD-020F

JEDEC J-STD-020F

JOINT IPC/JEDEC STANDARD FOR Moisture/Reflow Sensitivity Classification for Non-hermetic Surface Mount Devices (SMDs)

$144.00 $289.56

JEDEC JESD254

JEDEC JESD254

Secure Serial Flash Bus Transactions Version 1.0

$104.00 $208.74

JEDEC JESD47L

JEDEC JESD47L

Stress-Test-Driven Qualification of Integrated Circuits

$109.00 $219.54

JEDEC JEP163

JEDEC JEP163

SELECTION OF BURN-IN/LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS

$104.00 $208.97