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  • JEDEC JESD 22-A117B

JEDEC JESD 22-A117B

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST

JEDEC Solid State Technology Association, 03/01/2009

Publisher: JEDEC

File Format: PDF

$31.00$62.00


Published:01/03/2009

Pages:22

File Size:1 file , 170 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This method establishes a standard procedure for determining the data cycling endurance and data retention capability of non-volatile memory cells. It is intended as a qualification and monitor test procedure. This test is also applicable to FLASH EEPROM integrated circuits and Erasable Programmable Logic Devices (EPLD) with embedded EEPROM or FLASH memory.

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