JEDEC JESD 22-B108A

COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES

JEDEC Solid State Technology Association, 01/01/2003

Publisher: JEDEC

File Format: PDF

$26.00$53.00

Description

Published:01/01/2003

Pages:11

File Size:1 file , 69 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity for surface-mount semiconductor devices.

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