• JEDEC JESD 22-B110A (R2009)

JEDEC JESD 22-B110A (R2009)

SUBASSEMBLY MECHANICAL SHOCK

JEDEC Solid State Technology Association, 11/01/2004

Publisher: JEDEC

File Format: PDF

$28.00$56.00


Published:01/11/2004

Pages:15

File Size:1 file , 76 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

The new test method JESD22-B110 provides guidance for in-situ testing of mechanical shock resistance of components as mounted in a subassembly. Using terms, procedures, and test levels in common with JESD22-B104B, this test method provides a range of test level options to improve test applicability and compatibility with fragility test procedures. Test procedures are detailed, including test card and fixture needs, test tolerances, test documentation, component preparation, and definition of terms.

More JEDEC standard pdf

JEDEC /ESDA JTR002-01-22

JEDEC /ESDA JTR002-01-22

Charged Device Model Testing of Integrated Circuits

$145.00 $291.54

JEDEC /ESDA JS-002-2022

JEDEC /ESDA JS-002-2022

For Electrostatic Discharge Sensitivity Testing Charged Device Model (CDM) Device Level

$146.00 $292.43

JEDEC JESD238A

JEDEC JESD238A

High Bandwidth Memory DRAM (HBM3)

$147.00 $295.25

JEDEC JEP183A

JEDEC JEP183A

Guidelines for Measuring the Threshold Voltage (VT) of SiC MOSFETs

$104.00 $209.99