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JEDEC Solid State Technology Association, 05/01/2007
Publisher: JEDEC
File Format: PDF
$31.00$62.00
Published:01/05/2007
Pages:22
File Size:1 file , 130 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES
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MEASUREMENT OF SMALL SIGNAL HF, VHF, AND UHF POWER GAIN OF TRANSISTORS
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STANDARD FOR THE MEASUREMENT OF CRE
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MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
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