• JEDEC JESD 24-4 (R2002)

JEDEC JESD 24-4 (R2002)

ADDENDUM No. 4 to JESD24 - THERMAL IMPEDANCE MEASUREMENTS FOR BIPOLAR TRANSISTORS (DELTA BASE-EMITTER VOLTAGE METHOD)

JEDEC Solid State Technology Association, 11/01/1990

Publisher: JEDEC

File Format: PDF

$28.00$56.00


Published:01/11/1990

Pages:16

File Size:1 file , 350 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

The purpose of this test method is to measure the thermal impedance of the Bipolar Transistor under the specified conditions of applied voltage, current and pulse duration. The temperature sensitivity of the base-emitter voltage is used as the junction temperature indicator. This test method is used to measure the thermal response of the junction to a heating pulse. Specifically, the test may be used to measure dc thermal resistance, and to ensure proper die mountdown to its case. This is accomplished through the appropriate choice of pulse duration and heating power magnitude.

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