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JEDEC Solid State Technology Association, 11/01/1990
Publisher: JEDEC
File Format: PDF
$28.00$56.00
Published:01/11/1990
Pages:16
File Size:1 file , 350 KB
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Graphics Double Data Rate (GDDR5) SGRAM Standard
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Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices
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FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
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