JEDEC JESD 24-7 (R2002)

ADDENDUM No. 7 to JESD24 - COMMUTATING DIODE SAFE OPERATING AREA TEST PROCEDURE FOR MEASURING dv/dt DURING REVERSE RECOVERY OF POWER TRANSISTORS

JEDEC Solid State Technology Association, 08/01/1982

Publisher: JEDEC

File Format: PDF

$25.00$51.00

Published:01/08/1982

Pages:10

File Size:1 file , 150 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

Defines methods for verifying the diode recovery stress capability of power transistors.

EXTERNAL VISUAL

$27.00 $54.00

HSUL_12 LPDDR2 I/O

$36.00 $72.00

EMBEDDED MULTIMEDIACARD (e-MMC) MECHANICAL STANDARD, WITH OPTIONAL RESET SIGNAL

$27.00 $54.00

WIRE BOND SHEAR TEST

$31.00 $62.00