Your shopping cart is empty!
JEDEC Solid State Technology Association, 08/01/1992
Publisher: JEDEC
File Format: PDF
$25.00$51.00
Published:01/08/1992
Pages:9
File Size:1 file , 120 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
THERMAL TEST ENVIRONMENT MODIFICATIONS FOR MULTICHIP PACKAGES
$29.00 $59.00
FULLY BUFFERED DIMM DESIGN FOR TEST, DESIGN FOR VALIDATION (DFx)
$81.00 $163.00
MEASURING WHISKER GROWTH ON TIN AND TIN ALLOY SURFACE FINISHES
$37.00 $74.00
APPLICATION SPECIFIC QUALIFICATION USING KNOWLEDGE BASED TEST METHODOLOGY
$33.00 $67.00