Your shopping cart is empty!
JEDEC Solid State Technology Association, 02/01/1987
Publisher: JEDEC
File Format: PDF
$26.00$53.00
Published:01/02/1987
Pages:12
File Size:1 file , 240 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
SELECTION OF BURN-IN/LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS
$36.00 $72.00
Low Power Double Data Rate 3 SDRAM (LPDDR3)
$104.00 $209.00
STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST
$26.00 $53.00
PROCEDURE FOR THE EVQLUQTION OF LOW-k/METAL INTER/INTRA-LEVEL DIELECTRIC INTEGRITY
$37.00 $74.00