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  • JEDEC JESD 353 (R2009)

JEDEC JESD 353 (R2009)

THE MEASUREMENT OF TRANSISTOR NOISE FIGURE AT FREQUENCIES UP TO 20 kHz BY SINUSOIDAL SIGNAL-GENERATOR METHOD

JEDEC Solid State Technology Association, 04/01/1968

Publisher: JEDEC

File Format: PDF

$25.00$51.00


Published:01/04/1968

Pages:9

File Size:1 file , 240 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This noise measurement method applies to transistors whose noise has a Gaussian power distribution, to transistors whose noise has a flat (white) power distribution, and to transistors whose noise has a l/f (power inversely proportional to frequency) power distribution. Formerly known as RS-353 and/or EIA-353.

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