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  • JEDEC JESD 372 (R2009)

JEDEC JESD 372 (R2009)

THE MEASUREMENT OF SMALL-SIGNAL VHF-UHF TRANSISTOR ADMITTANCE PARAMETERS

JEDEC Solid State Technology Association, 05/01/1970

Publisher: JEDEC

File Format: PDF

$27.00$54.00


Published:01/05/1970

Pages:13

File Size:1 file , 350 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard describes the method to be used for the measurement of small-signal VHF-UHF transistor admittance parameters, in preparing data sheets for JEDEC registration of low power transistors. Formerly known as RS-372 and/or EIA-372.

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