JEDEC JESD 435 (R2009)

STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS

JEDEC Solid State Technology Association, 04/01/1976

Publisher: JEDEC

File Format: PDF

$31.00$62.00

Published:01/04/1976

Pages:23

File Size:1 file , 620 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435

ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST

$26.00 $53.00

DISCONTINUING USE OF THE MACHINE MODEL FOR DEVICE ESD QUALIFICATION

$31.00 $62.00

HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)

$27.00 $54.00

300 mV INTERFACE

$25.00 $51.00