JEDEC JESD 435 (R2009)

STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS

JEDEC Solid State Technology Association, 04/01/1976

Publisher: JEDEC

File Format: PDF

$31.00$62.00

Published:01/04/1976

Pages:23

File Size:1 file , 620 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435

System Level ESD Part II: Implementation of Effective ESD Robust Designs

$95.00 $191.00

Byte Addressable Energy Backed Interface

$114.00 $228.00

POD135 - 1.35 V Pseudo Open Drain I/O

$33.00 $67.00

POD125 - 1.25 V Pseudo Open Drain I/O

$30.00 $60.00