JEDEC JESD 435 (R2009)

STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS

JEDEC Solid State Technology Association, 04/01/1976

Publisher: JEDEC

File Format: PDF

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Published:01/04/1976

Pages:23

File Size:1 file , 620 KB

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This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435

EXTERNAL VISUAL

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HSUL_12 LPDDR2 I/O

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EMBEDDED MULTIMEDIACARD (e-MMC) MECHANICAL STANDARD, WITH OPTIONAL RESET SIGNAL

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WIRE BOND SHEAR TEST

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