Your shopping cart is empty!
JEDEC Solid State Technology Association, 08/01/1984
Publisher: JEDEC
File Format: PDF
$24.00$48.00
Published:01/08/1984
Pages:7
File Size:1 file , 200 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
$29.00 $59.00
DDR2 SDRAM SPECIFICATION
$95.00 $191.00
3D Chip Stack with Through-Silicon Vias (TSVS): Identifying, Evaluating and Understanding Reliability Interactions
$31.00 $62.00
TERMS, DEFINITIONS, AND LETTER SYMBOLS FOR DISCRETE SEMICONDUCTOR AND OPTOELECTRONIC DEVICES
$114.00 $228.00