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JEDEC Solid State Technology Association, 02/01/2008
Publisher: JEDEC
File Format: PDF
$70.00$141.00
Published:01/02/2008
Pages:85
File Size:1 file , 670 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
Secure Serial Flash Bus Transactions Version 1.0
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Stress-Test-Driven Qualification of Integrated Circuits
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SELECTION OF BURN-IN/LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS
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THERMAL SHOCK
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