• Your shopping cart is empty!

  • JEDEC JESD100B.01

JEDEC JESD100B.01

TERMS, DEFINITIONS, AND LETTER SYMBOLS FOR MICROCOMPUTERS, MICROPROCESSORS, AND MEMORY INTEGRATED CIRCUITS

JEDEC Solid State Technology Association, 12/01/2002

Publisher: JEDEC

File Format: PDF

$45.00$91.00


Published:01/12/2002

Pages:60

File Size:1 file , 520 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

A revised reference for technical writers and educators, manufacturers, buyers and users of microprocessors, microcomputers, mircocontrollers, memory ICs, and other complex devices. The terms and their definitions in this standard have been updated and are in general agreement with the latest publications of the IEEE and the IEC. The companion standard for other integrated circuits is JESD99A. Also included is a system for generating symbols for time intervals found in complex sequential circuits, including memories. JESD100B.01 is the first minor revision of JESD100-B, December 1999. Annex A briefly shows entries that have changed.

More JEDEC standard pdf

JEDEC JS 9703

JEDEC JS 9703

IPC/JEDEC-9703: Mechanical Shock Test Guidelines for Solder Joint Reliability

$43.00 $87.00

JEDEC JESD 22-A117B

JEDEC JESD 22-A117B

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST

$31.00 $62.00

JEDEC JEP146A

JEDEC JEP146A

GUIDELINES FOR SUPPLIER PERFORMANCE RATING

$30.00 $60.00

JEDEC JESD 22-A110C

JEDEC JESD 22-A110C

HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)

$27.00 $54.00