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JEDEC Solid State Technology Association, 04/01/2008
Publisher: JEDEC
File Format: PDF
$70.00$141.00
Published:01/04/2008
Pages:88
File Size:1 file , 1.1 MB
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LOW POWER DOUBLE DATA RATE 2 (LPDDR2)
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THERMAL TEST BOARD STANDARDS TO ACCOMMODATE MULTI-CHIP PACKAGES
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INTERFACE TEST METHOD FOR THE MEASUREMENT OF THE THERMAL RESISTANCE JUNCTION-TO-CASE OF SEMICONDUCTOR DEVICES WITH HEAT FLOW TROUGH A SINGLE PATH
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