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JEDEC Solid State Technology Association, 01/01/2007
Publisher: JEDEC
File Format: PDF
$95.00$191.00
Published:01/01/2007
Pages:128
File Size:1 file , 2 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
Guideline for Evaluating Gate Switching Instability of Silicon Carbide Metal-Oxide-Semiconductor Devices for Power Electronic Conversion
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DDR5 Registering Clock Driver Definition (DDR5RCD02)
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Guideline for Gate Oxide Reliability and Robustness Evaluation Procedures for Silicon Carbide Power MOSFETs
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Definition of the SSTVN16859 2.5-2.6 V 13-Bit to 26-Bit SSTL_2 Registered Buffer for PC1600, PC2100, PC2700, and PC3200 DDR DIMM Applications
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