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JEDEC Solid State Technology Association, 03/01/2007
Publisher: JEDEC
File Format: PDF
$38.00$76.00
Published:01/03/2007
Pages:35
File Size:1 file , 250 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
Graphics Double Data Rate (GDDR5) SGRAM Standard
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Descriptive Designation System for Semiconductor-device Packages
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Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
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Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities
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