JEDEC JESD213A

STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) - LEAD (Pb) CONTENT

JEDEC Solid State Technology Association, 04/01/2017

Publisher: JEDEC

File Format: PDF

$30.00$60.00


Published:01/04/2017

Pages:14

File Size:1 file , 160 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This document is intended to be used by Original Component Manufacturers who deliver electronic components and Original Equipment Manufacturers who are the platform system integrators. It is intended to be applied prior to delivery by the OCMs and may be used by OEM system engineers and procuring activities as well as U.S Government Department of Defense system engineers, procuring activities and repair centers. This Standard establishes the instrumentation, techniques, criteria, and methods to be utilized to quantify the amount of Lead (Pb) in Tin-Lead (Sn/Pb) alloys and electroplated finishes containing at least 3 weight percent (wt%) Lead (Pb) using X-Ray Fluorescence (XRF) equipment.

More JEDEC standard pdf

JEDEC JESD302 (R2009)

JEDEC JESD302 (R2009)

RANGES AND CONDITIONS FOR SPECIFYING BETA FOR LOW POWER, AUDIO FREQUENCY TRANSISTORS FOR ENTERTAINMENT SERVICE

$23.00 $47.00

JEDEC EIA 323 (R2002)

JEDEC EIA 323 (R2002)

AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES

$25.00 $51.00

JEDEC JESD306 (R2009)

JEDEC JESD306 (R2009)

MEASUREMENT OF SMALL SIGNAL HF, VHF, AND UHF POWER GAIN OF TRANSISTORS

$24.00 $48.00

JEDEC JESD340 (R2009)

JEDEC JESD340 (R2009)

STANDARD FOR THE MEASUREMENT OF CRE

$27.00 $54.00