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JEDEC Solid State Technology Association, 11/01/2018
Publisher: JEDEC
File Format: PDF
$104.00$208.00
Published:01/11/2018
Pages:152
File Size:1 file , 2 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
A PROCEDURE FOR MEASURING P-CHANNEL MOSFET NEGATIVE BIAS TEMPERATURE INSTABILITIES
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DEFINITION OF THE SSTV16857 2.5 V, 14-BIT SSTL_2 REGISTERED BUFFER FOR DDR DIMM APPLICATIONS
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HIGH TEMPERATURE STORAGE LIFE
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SUBASSEMBLY MECHANICAL SHOCK
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