JEDEC JESD217A

Test Methods to Characterize Voiding in Pre-SMT Ball Grid Array Packages

JEDEC Solid State Technology Association, 11/01/2022

Publisher: JEDEC

File Format: PDF

$149.00$299.61


Published:01/11/2022

Pages:48

File Size:1 file , 2.2 MB

Note:This product is unavailable in Russia, Ukraine, Belarus

This publication provides an overview of solder void types, outlines current metrologies and test methods used for pre-SMPT solder void characterization and potential limitations, and prescribes sampling strategy for data collection, and tolerance guidelines for corrective measures.

More JEDEC standard pdf

JEDEC JESD8-18A

JEDEC JESD8-18A

FBDIMM SPECIFICATION: HIGH SPEED DIFFERENTIAL PTP LINK AT 1.5 V

$53.00 $106.00

JEDEC JESD 79F

JEDEC JESD 79F

DOUBLE DATA RATE (DDR) SDRAM SPECIFICATION

$70.00 $141.00

JEDEC JESD22-A120A

JEDEC JESD22-A120A

TEST METHOD FOR THE MEASUREMENT OF MOISTURE DIFFUSIVITY AND WATER SOLUBILITY IN ORGANIC MATERIALS USED IN INTEGRATED CIRCUITS

$27.00 $54.00

JEDEC JEP153

JEDEC JEP153

CHARACTERIZATION AND MONITORING OF THERMAL STRESS TEST OVEN TEMPURATURES

$30.00 $60.00