• JEDEC JESD22-A100-A

JEDEC JESD22-A100-A

Solid State Devices, Testing Quality and Reliability - Test Method A100: Cycled Temperature Humidity Bias Life Test

JEDEC Solid State Technology Association, 01/01/1989

Publisher: JEDEC

File Format: PDF

$111.00$223.64


Published:01/01/1989

More JEDEC standard pdf

JEDEC JESD76-3

JEDEC JESD76-3

STANDARD DESCRIPTION OF 1.5 V CMOS LOGIC DEVICES

$24.00 $48.00

JEDEC JESD75-3

JEDEC JESD75-3

BALL GRID ARRAY PINOUTS STANDARDIZED FOR 8-BIT LOGIC FUNCTIONS

$23.00 $47.00

JEDEC JESD73-2

JEDEC JESD73-2

STANDARD FOR DESCRIPTION OF 3.3 V NFET BUS SWITCH DEVICES WITH INTEGRATED CHARGE PUMPS

$25.00 $51.00

JEDEC JESD75-2

JEDEC JESD75-2

BALL GRID ARRAY PINOUTS STANDARDIZED FOR 16-BIT LOGIC FUNCTIONS

$24.00 $48.00