JEDEC JESD22-A100-A

Solid State Devices, Testing Quality and Reliability - Test Method A100: Cycled Temperature Humidity Bias Life Test

JEDEC Solid State Technology Association, 01/01/1989

Publisher: JEDEC

File Format: PDF

$111.00$223.64

Published:01/01/1989

System Level ESD: Part II: Implementation of Effective ESD Robust Designs

$95.00 $191.00

GUIDELINES FOR REPORTING AND USING ELECTRONIC PACKAGE THERMAL INFORMATION

$36.00 $72.00

ZENER AND VOLTAGE REGULATOR DIODE RATING VERIFICATION AND CHARACTERIZATION TESTING

$34.00 $69.00

NAND Flash Interface Interoperability

$37.00 $74.00