JEDEC JESD22-A100-A

Solid State Devices, Testing Quality and Reliability - Test Method A100: Cycled Temperature Humidity Bias Life Test

JEDEC Solid State Technology Association, 01/01/1989

Publisher: JEDEC

File Format: PDF

$111.00$223.64

Published:01/01/1989

EXTERNAL VISUAL

$27.00 $54.00

HSUL_12 LPDDR2 I/O

$36.00 $72.00

EMBEDDED MULTIMEDIACARD (e-MMC) MECHANICAL STANDARD, WITH OPTIONAL RESET SIGNAL

$27.00 $54.00

WIRE BOND SHEAR TEST

$31.00 $62.00