• JEDEC JESD22-A105C (R2011)

JEDEC JESD22-A105C (R2011)

POWER AND TEMPERATURE CYCLING

JEDEC Solid State Technology Association, 01/01/2004

Publisher: JEDEC

File Format: PDF

$25.00$51.00


Published:01/01/2004

Pages:10

File Size:1 file , 49 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

The power and temperature cycling test is performed to determine the ability of a device to withstand alternate exposures at high and low temperature extremes and simultaneously the operating biases are periodically applied and removed. It is intended to simulate worst case conditions encountered in application environments. The power and temperature cycling test is considered destructive and is only intended for device qualification. This test method applies to semiconductor devices that are subjected to temperature excursions and required to power on and off during all temperatures.

More JEDEC standard pdf

JEDEC JESD 22-B105C (R2006)

JEDEC JESD 22-B105C (R2006)

LEAD INTEGRITY

$30.00 $60.00

JEDEC JEP104C.01

JEDEC JEP104C.01

REFERENCE GUIDE TO LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES

$58.00 $116.00

JEDEC JEP145

JEDEC JEP145

GUIDELINE FOR ASSESSING THE CURRENT-CARRYING CAPABILITY OF THE LEADS IN A POWER PACKAGE SYSTEM

$26.00 $53.00

JEDEC JESD 22-B108A

JEDEC JESD 22-B108A

COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES

$26.00 $53.00