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JEDEC Solid State Technology Association, 12/01/2022
Publisher: JEDEC
File Format: PDF
$112.00$225.35
Published:01/12/2022
Pages:13
File Size:1 file , 170 KB
Note:This product is unavailable in Russia, Belarus
This test is conducted to determine the robustness of a device to sudden exposure to extreme changes in temperature and to the effect of alternate exposures to these extremes.
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COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES
SILICON RECTIFIER DIODES
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TERMS, DEFINITIONS, AND LETTER SYMBOLS FOR MICROCOMPUTERS, MICROPROCESSORS, AND MEMORY INTEGRATED CIRCUITS
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