Your shopping cart is empty!
PDF Preview
JEDEC Solid State Technology Association, 12/01/2022
Publisher: JEDEC
File Format: PDF
$112.00$225.35
Published:01/12/2022
Pages:13
File Size:1 file , 170 KB
Note:This product is unavailable in Russia, Belarus
This test is conducted to determine the robustness of a device to sudden exposure to extreme changes in temperature and to the effect of alternate exposures to these extremes.
Universal Flash Storage Host Controller Interface (UFSHCI)
$70.00 $141.00
Universal Flash Storage (UFS)
$177.00 $355.00
Serial Interface for Data Converters
$152.00 $305.00
INFORMATION REQUIREMENTS FOR THE QUALIFICATION OF SILICON DEVICES
$27.00 $54.00