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JEDEC Solid State Technology Association, 07/01/2001
Publisher: JEDEC
File Format: PDF
$27.00$54.00
Published:01/07/2001
Pages:14
File Size:1 file , 110 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION
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ADDENDUM No. 11 to JESD24 - POWER MOSFET EQUIVALENT SERIES GATE RESISTANCE TEST METHOD
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