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JEDEC Solid State Technology Association, 06/01/2016
Publisher: JEDEC
File Format: PDF
$30.00$60.00
Published:01/06/2016
Pages:21
File Size:1 file , 120 KB
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Solid State Devices, Testing Quality and Reliability - Test Method A100: Cycled Temperature Humidity Bias Life Test
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ADDENDUM No. 5 to JESD12 - DESIGN FOR TESTABILITY GUIDELINES
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GUIDELINES FOR THE MEASUREMENT OF THERMAL RESISTANCE OF GaAs FETS
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METAL PACKAGE SPECIFICATION FOR MICROELECTRONIC PACKAGES AND COVERS
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