Your shopping cart is empty!
JEDEC Solid State Technology Association, 06/01/2002
Publisher: JEDEC
File Format: PDF
$27.00$54.00
Published:01/06/2002
Pages:14
File Size:1 file , 170 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
QUALITY SYSTEM ASSESSMENT (SUPERSEDES JESD39-A)
$40.00 $80.00
THERMAL TEST CHIP GUIDELINE (WIRE BOND TYPE CHIP)
$28.00 $56.00
TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION
$43.00 $87.00
ADDENDUM No. 11 to JESD24 - POWER MOSFET EQUIVALENT SERIES GATE RESISTANCE TEST METHOD
$24.00 $48.00