• JEDEC JESD22-B105D

JEDEC JESD22-B105D

Lead Integrity

JEDEC Solid State Technology Association, 07/01/2011

Publisher: JEDEC

File Format: PDF

$31.00$62.00


Published:01/07/2011

Pages:22

File Size:1 file , 140 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This test method provides various tests for determining the integrity lead/package interface and the lead itself when the lead(s) are bent due to faulty board assembly followed by rework of the part for reassembly. For hermetic packages it is recommend that this test be followed by hermeticity tests in accordance with Test Method A109 to determine if there are any adverse effects from the stresses applied to the seals as well as to the leads. These tests, including each of its test conditions, is considered destructive and is only recommended for qualification testing. This test is applicable to all through-hole devices and surface-mount devices requiring lead forming by the user.

More JEDEC standard pdf

JEDEC JESD302 (R2009)

JEDEC JESD302 (R2009)

RANGES AND CONDITIONS FOR SPECIFYING BETA FOR LOW POWER, AUDIO FREQUENCY TRANSISTORS FOR ENTERTAINMENT SERVICE

$23.00 $47.00

JEDEC EIA 323 (R2002)

JEDEC EIA 323 (R2002)

AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES

$25.00 $51.00

JEDEC JESD306 (R2009)

JEDEC JESD306 (R2009)

MEASUREMENT OF SMALL SIGNAL HF, VHF, AND UHF POWER GAIN OF TRANSISTORS

$24.00 $48.00

JEDEC JESD340 (R2009)

JEDEC JESD340 (R2009)

STANDARD FOR THE MEASUREMENT OF CRE

$27.00 $54.00