• JEDEC JESD22-B110B

JEDEC JESD22-B110B

Mechanical Shock - Component and Subassembly

JEDEC Solid State Technology Association, 07/01/2013

Publisher: JEDEC

File Format: PDF

$27.00$54.00


Published:01/07/2013

Pages:14

File Size:1 file , 150 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

Component and Subassembly Mechanical Shock Test Method is intended to evaluate components in the free state and assembled to printed wiring boards for use in electrical equipment. The method is intended to determine the compatibility of components and subassemblies to withstand moderately severe shocks. The use of subassemblies is a means to test components in usage conditions as assembled to printed wiring boards. Mechanical Shock due to suddenly applied forces, or abrupt change in motion produced by handling, transportation or field operation may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test intended for component qualification. This document also replaces JESD22-B104.

More JEDEC standard pdf

JEDEC JESD 236-C (R2009)

JEDEC JESD 236-C (R2009)

COLOR CODING OF DISCRETE SEMICONDUCTOR DEVICES

$25.00 $51.00

JEDEC JESD 24

JEDEC JESD 24

POWER MOSFETS

$45.00 $91.00

JEDEC JESD 12-2

JEDEC JESD 12-2

ADDENDUM No. 2 to JESD12 - STANDARD FOR CELL-BASED INTEGRATED CIRCUIT BENCHMARK SET

$39.00 $78.00

JEDEC JESD12

JEDEC JESD12

SEMICUSTOM INTEGRATED CIRCUITS (FORMERLY PUBLISHED AS STANDARD FOR GATE ARRAY BENCHMARK SET)

$27.00 $54.00