• JEDEC JESD22-B110B

JEDEC JESD22-B110B

Mechanical Shock - Component and Subassembly

JEDEC Solid State Technology Association, 07/01/2013

Publisher: JEDEC

File Format: PDF

$27.00$54.00


Published:01/07/2013

Pages:14

File Size:1 file , 150 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

Component and Subassembly Mechanical Shock Test Method is intended to evaluate components in the free state and assembled to printed wiring boards for use in electrical equipment. The method is intended to determine the compatibility of components and subassemblies to withstand moderately severe shocks. The use of subassemblies is a means to test components in usage conditions as assembled to printed wiring boards. Mechanical Shock due to suddenly applied forces, or abrupt change in motion produced by handling, transportation or field operation may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test intended for component qualification. This document also replaces JESD22-B104.

More JEDEC standard pdf

JEDEC JESD2

JEDEC JESD2

DIGITAL BIPOLAR LOGIC PINOUTS FOR CHIP CARRIERS

$26.00 $53.00

JEDEC JESD 1

JEDEC JESD 1

LEADLESS CHIP CARRIER PINOUTS STANDARDIZED FOR LINEARS

$26.00 $53.00

JEDEC JESD 23

JEDEC JESD 23

TEST METHODS AND CHARACTER DESIGNATION FOR LIQUID CRYSTAL DEVICES:

$37.00 $74.00

JEDEC JESD 24-7 (R2002)

JEDEC JESD 24-7 (R2002)

ADDENDUM No. 7 to JESD24 - COMMUTATING DIODE SAFE OPERATING AREA TEST PROCEDURE FOR MEASURING dv/dt DURING REVERSE RECOVERY OF POWER TRANSISTORS

$25.00 $51.00