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JEDEC Solid State Technology Association, 03/01/2006
Publisher: JEDEC
File Format: PDF
$31.00$62.00
Published:01/03/2006
Pages:21
File Size:1 file , 250 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
Graphics Double Data Rate (GDDR5) SGRAM Standard
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Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices
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FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
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