The Board Level Cyclic Bend Test Method is intended to evaluate and compare the performance of surface mount electronic components in an accelerated test environment for handheld electronic products applications. The purpose is to standardize the test methodology to provide a reproducible performance assessment of surface mounted components while duplicating the failure modes normally observed during product level test. This is not a component qualification test and is not meant to replace any product level test that may be needed to qualify a specific product and assembly.
More JEDEC standard pdf
JEDEC JESD209-4-1A
Addendum No. 1 to JESD209-4 - Low Power Double Data Rate 4 (LPDDR4)
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