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JEDEC Solid State Technology Association, 08/01/2009
Publisher: JEDEC
File Format: PDF
$31.00$62.00
Published:01/08/2009
Pages:17
File Size:1 file , 220 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
SEMICONDUCTOR WAFER AND DIE BACKSIDE EXTERNAL VISUAL INSPECTION
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AND LABELING OF COMPONENTS, PCBs AND PCBAs TO IDENTIFY LEAD (Pb), Pb-FREE AND OTHER ATTRIBUTES
Universal Flash Storage (UFS)
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SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD
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