Your shopping cart is empty!
JEDEC Solid State Technology Association, 05/01/2014
Publisher: JEDEC
File Format: PDF
$31.00$62.00
Published:01/05/2014
Pages:22
File Size:1 file , 310 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) - LEAD (Pb) CONTENT
$26.00 $53.00
ELECTROSTATIC DISCHARGE SENSITIVITY TESTING, HUMAN BODY MODEL (HBM) - COMPONENT LEVEL
$39.00 $78.00
ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING MACHINE MODEL (MM)
$27.00 $54.00
PROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICS
$43.00 $87.00