• Your shopping cart is empty!

  • JEDEC JESD237

JEDEC JESD237

Reliability Qualification of Power Amplifier Modules

JEDEC Solid State Technology Association, 03/01/2014

Publisher: JEDEC

File Format: PDF

$33.00$67.00


Published:01/03/2014

Pages:24

File Size:1 file , 200 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard is intended to identify a core set of qualification tests that apply specifically for Power Amplifier Modules and their primary application in mobile devices such as cellular phones. This standard is intended to describe specific stresses and failure mechanisms that are specific to compound semiconductors and power amplifier modules. It is intended to establish more meaningful and efficient qualification testing.

More JEDEC standard pdf

JEDEC JESD250A

JEDEC JESD250A

Graphics Double Data Rate (GDDR6) SGRAM Standard

$114.00 $228.00

JEDEC JESD251

JEDEC JESD251

EXPANDED SERIAL PERIPHERAL INTERFACE (xSPI) FOR NON VOLATILE MEMORY DEVICES, VERSION 1.0

$58.00 $116.00

JEDEC JESD22-A117D

JEDEC JESD22-A117D

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST

$33.00 $67.00

JEDEC JEP132A

JEDEC JEP132A

PROCESS CHARACTERIZATION GUIDELINE

$39.00 $78.00