• Your shopping cart is empty!

  • JEDEC JESD237

JEDEC JESD237

Reliability Qualification of Power Amplifier Modules

JEDEC Solid State Technology Association, 03/01/2014

Publisher: JEDEC

File Format: PDF

$33.00$67.00


Published:01/03/2014

Pages:24

File Size:1 file , 200 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard is intended to identify a core set of qualification tests that apply specifically for Power Amplifier Modules and their primary application in mobile devices such as cellular phones. This standard is intended to describe specific stresses and failure mechanisms that are specific to compound semiconductors and power amplifier modules. It is intended to establish more meaningful and efficient qualification testing.

More JEDEC standard pdf

JEDEC JEP150.01

JEDEC JEP150.01

STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SURFACE-MOUNT COMPONENTS

$33.00 $67.00

JEDEC JESD212A

JEDEC JESD212A

GDDR5 SGRAM

$95.00 $191.00

JEDEC JESD30F

JEDEC JESD30F

Descriptive Designation System for Semiconductor-device Packages

$37.00 $74.00

JEDEC JEP167

JEDEC JEP167

Characterization of Interfacial Adhesion in Semiconductor Packages

$36.00 $72.00