JEDEC JESD25 (R2002)

MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS

JEDEC Solid State Technology Association, 11/01/1972

Publisher: JEDEC

File Format: PDF

$37.00$74.00

Published:01/11/1972

Pages:30

File Size:1 file , 480 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard provides a test method and definition for small-signal conditions at microwave frequencies.

TEST BOARDS FOR THROUGH-HOLE AREA ARRAY LEADED PACKAGE THERMAL MEASUREMENT

$29.00 $59.00

ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST

$26.00 $53.00

GUIDELINE FOR CONSTANT TEMPERATURE AGING TO CHARACTERIZE ALUMINUM INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDING

$29.00 $59.00

TEST METHODS AND ACCEPTANCE PROCEDURES FOR THE EVALUATION OF POLYMERIC MATERIALS

$33.00 $67.00