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JEDEC Solid State Technology Association, 02/01/2020
Publisher: JEDEC
File Format: PDF
$58.00$116.00
Published:01/02/2020
Pages:78
File Size:1 file , 1.7 MB
Note:This product is unavailable in Russia, Ukraine, Belarus
A PROCEDURE FOR MEASURING P-CHANNEL MOSFET NEGATIVE BIAS TEMPERATURE INSTABILITIES
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DEFINITION OF THE SSTV16857 2.5 V, 14-BIT SSTL_2 REGISTERED BUFFER FOR DDR DIMM APPLICATIONS
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HIGH TEMPERATURE STORAGE LIFE
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SUBASSEMBLY MECHANICAL SHOCK
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