JEDEC JESD28-1

N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS

JEDEC Solid State Technology Association, 09/01/2001

Publisher: JEDEC

File Format: PDF

$27.00$54.00

Description

Published:01/09/2001

Pages:14

File Size:1 file , 55 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.

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