• Your shopping cart is empty!

  • JEDEC JESD28-1

JEDEC JESD28-1

N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS

JEDEC Solid State Technology Association, 09/01/2001

Publisher: JEDEC

File Format: PDF

$27.00$54.00


Published:01/09/2001

Pages:14

File Size:1 file , 55 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.

More JEDEC standard pdf

JEDEC JEP142 (R2023)

JEDEC JEP142 (R2023)

GUIDELINE FOR OBTAINING AND ACCEPTING MATERIAL FOR USE IN HYBRID / MCM PRODUCTS

$107.00 $214.01

JEDEC JESD28-A

JEDEC JESD28-A

A PROCEDURE FOR MEASURING N-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION UNDER DC STRESS

$29.00 $59.00

JEDEC JESD73-3

JEDEC JESD73-3

STANDARD FOR DESCRIPTION OF 3867 - 2.5 V, SINGLE 10-BIT, 2-PORT, DDR FET SWITCH

$25.00 $51.00

JEDEC JESD8-13

JEDEC JESD8-13

SCALABLE LOW-VOLTAGE SIGNALING FOR 400 MV (SLVS-400)

$26.00 $53.00