JEDEC JESD284-A (R2002)

TEST METHODS FOR THE COLLECTOR-BASE TIME CONSTANT AND FOR THE RESISTIVE PART OF THE COMMON-EMITTER INPUT IMPEDANCE

JEDEC Solid State Technology Association, 11/01/1963

Publisher: JEDEC

File Format: PDF

$24.00$48.00

Description

Published:01/11/1963

Pages:8

File Size:1 file , 300 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

The test methods described in this Standard are generally applicable to alloy-like devices for which the usual simplified equivalent circuits can be employed. Formerly known as EIA-284-A (November 1963). Became JESD284-A when reaffirmed in October 2002.

More JEDEC standard pdf

JEDEC JESD84-A441

EMBEDDED MULTIMEDIACARD(e*MMC) e*MMC/CARD PRODUCT STANDARD, HIGH CAPACITY, including Reliable Write, Boot, Sleep Modes, Dual Data Rate, Multiple Partitions Supports, Security Enhancement, Background Operation and High Priority Interrupt (MMCA, 4.41)

$123.00 $247.00

JEDEC JESD 47G.01

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

$33.00 $67.00

JEDEC JESD213

STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) - LEAD (Pb) CONTENT

$26.00 $53.00

JEDEC JS 001

ELECTROSTATIC DISCHARGE SENSITIVITY TESTING, HUMAN BODY MODEL (HBM) - COMPONENT LEVEL

$39.00 $78.00