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  • JEDEC JESD311-A (R2009)

JEDEC JESD311-A (R2009)

MEASUREMENT OF TRANSISTOR NOISE FIGURE AT MF, HF, AND VHF

JEDEC Solid State Technology Association, 11/01/1981

Publisher: JEDEC

File Format: PDF

$30.00$60.00


Published:01/11/1981

Pages:20

File Size:1 file , 550 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard describes a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. This standard also adds the necessary information to make 'effective input noise temperature measurements'. This method is a revision of EIA-311 and incorporates material previously found in EIA-283. Formerly known as RS-311A and/or EIA-311-A.

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