JEDEC JESD313-B (R2001)

THERMAL RESISTANCE MEASUREMENTS OF CONDUCTION COOLED POWER TRANSISTORS

JEDEC Solid State Technology Association, 10/01/1975

Publisher: JEDEC

File Format: PDF

$28.00$56.00

Published:01/10/1975

Pages:15

File Size:1 file , 600 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard provides a test method for measuring thermal resistance for conduction cooled power transistors.

SEMICUSTOM INTEGRATED CIRCUITS (FORMERLY PUBLISHED AS STANDARD FOR GATE ARRAY BENCHMARK SET)

$27.00 $54.00

CHIP CARRIER PINOUTS STANDARDIZED FOR CMOS 4000, HC AND HCT SERIES OF LOGIC CIRCUITS

$26.00 $53.00

DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODES

$24.00 $48.00

LIST OF PREFERRED VALUES FOR USE ON VARIOUS TYPES OF SMALL SIGNAL AND REGULATOR DIODES

$24.00 $48.00