• Your shopping cart is empty!

  • JEDEC JESD340 (R2009)

JEDEC JESD340 (R2009)

STANDARD FOR THE MEASUREMENT OF CRE

JEDEC Solid State Technology Association, 11/01/1967

Publisher: JEDEC

File Format: PDF

$27.00$54.00


Published:01/11/1967

Pages:13

File Size:1 file , 410 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard offers an easily measured parameter which is one of the significant characteristics in determining the stability of a transistor intended for small-signal operation. The measurement technique allows rapid testing. Its correlation to AC stability will help to establish the interchangeability of a device. Formerly known as RS-340 and/or EIA-340.

More JEDEC standard pdf

JEDEC JESD18-A

JEDEC JESD18-A

STANDARD FOR DESCRIPTION OF FAST CMOS TTL COMPATIBLE LOGIC

$40.00 $80.00

JEDEC JESD8-2

JEDEC JESD8-2

ADDENDUM No. 2 to JESD8 - STANDARD FOR OPERATING VOLTAGES AND INTERFACE LEVELS FOR LOW VOLTAGE EMITTER-COUPLED LOGIC (ECL) INTEGRATED CIRCUITS

$25.00 $51.00

JEDEC JESD 320-A (R2002)

JEDEC JESD 320-A (R2002)

CONDITIONS FOR MEASUREMENT OF DIODE STATIC PARAMETERS

$23.00 $47.00

JEDEC JEP118

JEDEC JEP118

GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING

$30.00 $60.00