• Your shopping cart is empty!

  • JEDEC JESD398 (R2009)

JEDEC JESD398 (R2009)

MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE

JEDEC Solid State Technology Association, 07/01/1972

Publisher: JEDEC

File Format: PDF

$27.00$54.00


Published:01/07/1972

Pages:14

File Size:1 file , 420 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard contains a three-terminal procedure for capacitance measurement with due precautions for shielding of extraneous effects due to terminal leads and metal enclosures. Formerly known as RS-398 and/or EIA-398

More JEDEC standard pdf

JEDEC JESD 12-4

JEDEC JESD 12-4

ADDENDUM No. 4 to JESD12 - METHOD OF SPECIFICATION OF PERFORMANCE PARAMETERS FOR CMOS SEMICUSTOM INTEGRATED CIRCUITS

$30.00 $60.00

JEDEC JESD 321-C (R2009)

JEDEC JESD 321-C (R2009)

NUMBERING OF LIKE-NAMED TERMINAL FUNCTIONS IN SEMICONDUCTOR DEVICES AND DESIGNATION OF UNITS IN MULTIPLE-UNIT SEMICONDUCTOR DEVICES

$26.00 $53.00

JEDEC JESD14 (R2002)

JEDEC JESD14 (R2002)

SEMICONDUCTOR POWER CONTROL MODULES

$29.00 $59.00

JEDEC JEP64 (R2002)

JEDEC JEP64 (R2002)

SOLID STATE PRODUCTS REGISTRATION LIST(ORDER FROM TYPE ADMINISTRATION OFFICE)

$104.00 $208.00