• JEDEC JESD398 (R2009)

JEDEC JESD398 (R2009)

MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE

JEDEC Solid State Technology Association, 07/01/1972

Publisher: JEDEC

File Format: PDF

$27.00$54.00


Published:01/07/1972

Pages:14

File Size:1 file , 420 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard contains a three-terminal procedure for capacitance measurement with due precautions for shielding of extraneous effects due to terminal leads and metal enclosures. Formerly known as RS-398 and/or EIA-398

More JEDEC standard pdf

JEDEC JESD235D

JEDEC JESD235D

High Bandwidth Memory (HBM) DRAM (HBM1, HBM2)

$123.00 $247.00

JEDEC JESD250C

JEDEC JESD250C

Graphics Double Data Rate 6 (GDDR6) 5GRAM Standard

$114.00 $228.00

JEDEC JESD253

JEDEC JESD253

Enclosure Form Factor For SSD Devices, Version 1.0

$30.00 $60.00

JEDEC JEP178

JEDEC JEP178

Electrostatic Discharge (ESD) Sensitivity Testing - Reporting ESD Withstand Levels on Datasheets

$27.00 $54.00