• JEDEC JESD4 (R2002)

JEDEC JESD4 (R2002)

DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODES

JEDEC Solid State Technology Association, 11/01/1983

Publisher: JEDEC

File Format: PDF

$24.00$48.00


Published:01/11/1983

Pages:8

File Size:1 file , 280 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard defines reference distances between terminals of the device and the external package at specific voltages.

More JEDEC standard pdf

JEDEC JESD 47G.01

JEDEC JESD 47G.01

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

$33.00 $67.00

JEDEC JESD213

JEDEC JESD213

STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) - LEAD (Pb) CONTENT

$26.00 $53.00

JEDEC JS 001

JEDEC JS 001

ELECTROSTATIC DISCHARGE SENSITIVITY TESTING, HUMAN BODY MODEL (HBM) - COMPONENT LEVEL

$39.00 $78.00

JEDEC JESD 22-A115B

JEDEC JESD 22-A115B

ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING MACHINE MODEL (MM)

$27.00 $54.00