JEDEC JESD4 (R2002)

DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODES

JEDEC Solid State Technology Association, 11/01/1983

Publisher: JEDEC

File Format: PDF

$24.00$48.00

Published:01/11/1983

Pages:8

File Size:1 file , 280 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard defines reference distances between terminals of the device and the external package at specific voltages.

GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING

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STANDARD LOGNORMAL ANALYSIS OF UNCENSORED DATA, AND OF SINGLY RIGHT -CENSORED DATA UTILIZING THE PERSSON AND ROOTZEN METHOD

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ADDENDUM No. 8 to JESD24 - METHOD FOR REPETITIVE INDUCTIVE LOAD AVALANCHE SWITCHING

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ADDENDUM No. 9 to JESD24 - SHORT CIRCUIT WITHSTAND TIME TEST METHOD

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