JEDEC JESD47K

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

JEDEC Solid State Technology Association, 08/01/2018

Publisher: JEDEC

File Format: PDF

$38.00$76.00

Description

Published:01/08/2018

Pages:34

File Size:1 file , 660 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.

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