• Your shopping cart is empty!

  • JEDEC JESD51-1

JEDEC JESD51-1

INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD - ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)

JEDEC Solid State Technology Association, 12/01/1995

Publisher: JEDEC

File Format: PDF

$39.00$78.00


Published:01/12/1995

Pages:36

File Size:1 file , 560 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

The purpose of this test method is to define a standard Electrical Test Method (ETM) that can be used to determine the thermal characteristics of single integrated circuit devices housed in some form of electrical package. This method will provide a basis for comparison of different devices housed in the same electronic package or similar devices housed in different electronic packages.

More JEDEC standard pdf

JEDEC JESD89-2A

JEDEC JESD89-2A

TEST METHOD FOR ALPHA SOURCE ACCELERATED SOFT ERROR RATE

$30.00 $60.00

JEDEC JESD8-12A.01

JEDEC JESD8-12A.01

1.2 V +/- 0.1 V (NORMAL RANGE) AND 0.8 - 1.3 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUITS

$26.00 $53.00

JEDEC JESD 8-11A.01

JEDEC JESD 8-11A.01

ADDENDUM No. 11A.01 to JESD8 - 1.5 V +/- 0.1 V (NORMAL RANGE) AND 0.9 - 1.6 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUITS

$26.00 $53.00

JEDEC JESD8C.01

JEDEC JESD8C.01

INTERFACE STANDARD FOR NOMINAL 3.0 V/3.3 V SUPPLY DIGITAL INTEGRATED CIRCUITS

$28.00 $56.00