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JEDEC Solid State Technology Association, 06/01/2001
Publisher: JEDEC
File Format: PDF
$29.00$59.00
Published:01/06/2001
Pages:17
File Size:1 file , 210 KB
Note:This product is unavailable in Russia, Ukraine, Belarus
INTERFACE TEST METHOD FOR THE MEASUREMENT OF THE THERMAL RESISTANCE JUNCTION-TO-CASE OF SEMICONDUCTOR DEVICES WITH HEAT FLOW TROUGH A SINGLE PATH
$40.00 $80.00
HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
$27.00 $54.00
ACCELERATED MOISTURE RESISTANCE - UNBIASED AUTOCLAVE
$24.00 $48.00
ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING MACHINE MODEL (MM)