• Your shopping cart is empty!

  • JEDEC JESD51-13

JEDEC JESD51-13

Glossary of Thermal Measurement Terms and Definitions

JEDEC Solid State Technology Association, 06/01/2009

Publisher: JEDEC

File Format: PDF

$27.00$54.00


Published:01/06/2009

Pages:14

File Size:1 file , 160 KB

Note:This product is unavailable in Russia, Ukraine, Belarus

This document provides a unified collection of the commonly used terms and definitions in the area of semiconductor thermal measurements. The terms and definitions provided herein extend beyond those used in the JESD51 family of documents to include other often used terms and definitions in the area of semiconductor thermal measurements.

More JEDEC standard pdf

JEDEC JESD82-10A

JEDEC JESD82-10A

DEFINITION OF THE SSTU32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS

$40.00 $80.00

JEDEC JEP152

JEDEC JEP152

DDR2 DIMM CLOCK SKEW MEASUREMENT PROCEDURE USING A CLOCK REFERENCE BOARD

$36.00 $72.00

JEDEC J-STD-609

JEDEC J-STD-609

MARKING AND LABELING OF COMPONENTS, PCBs AND PCBAs TO IDENTIFY LEAD (Pb), Pb-FREE AND OTHER ATTRIBUTES

$29.00 $59.00

JEDEC JESD82-16A

JEDEC JESD82-16A

DEFINITION OF THE SSTUA32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY TEST FOR DDR2 RDIMM APPLICATIONS

$40.00 $80.00